The Jeol JSM-IT500LA is a variable pressure scanning electron microscope equiped with energy dispersive spectroscopy. The instrument uses a tungsten filament and can yield high quality images of inorganic and organic materials and at variable accelerating voltages from 30 kev to 1 keV. Gold and carbon coating is available.
Potential Results
Secondary electron images, backscatter electron images, qualitative and quantitative elemental analysis